Investigating Structural and Optical Properties of CZTS Thin Films through Ag and Ge Alloying


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Authors

DOI:

https://doi.org/10.5281/zenodo.8007885

Keywords:

CZTS, Ag-CZTS, Ge-CZTS, Sputtering, Thin film

Abstract

In this study, the effect of Ag and Ge doping on the structural and optical properties of CZTS thin films was investigated. Undoped, Ag-doped, and Ge-doped CZTS samples were fabricated by two-step process involving sputter deposition of precursor films on the Mo-coated glass substrates and the sulfurization process of these films by Rapid Thermal Annealing (RTA) method. Prepared samples were characterized through several methods. EDX measurements revealed that all samples had Cu-poor and Zn-rich chemical composition regardless of the dopant materials. Furthermore, Ag and Ge concentrations were found to be 4% and 13%, respectively. XRD spectra of CZTS samples revealed only diffraction peaks of the kesterite CZTS phase. It was observed in extended XRD graphs that there was a slight shift in the diffraction peaks of doped CZTS samples due to incorporating Ag and Ge in the host lattice, as expected. Raman spectra of the films confirmed the formation of kesterite CZTS phase. In addition, it was seen that the formation of CTS phase was prevented by doping of CZTS thin films through Ag and Ge dopant materials. The optical band gap of CZTS, Ge-CZTS, and Ag-CZTS thin films was found as 1.50, 1.52 and 1.55 eV, respectively. Overall, it was demonstrated that Ag and Ge doping was performed successfully and prevented the formation of a secondary phase, which has an adverse effect on potential solar cell performance.

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Published

2023-06-25

How to Cite

Olğar, M. A., Zan, R., Çiriş, A., & Atasoy, Y. (2023). Investigating Structural and Optical Properties of CZTS Thin Films through Ag and Ge Alloying . Journal of NanoScience in Advanced Materials, 2(1), 7–11. https://doi.org/10.5281/zenodo.8007885

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Section

Regular Article
Received 2023-04-27
Accepted 2023-05-18
Published 2023-06-25